CRC-IEEE BAST Workshop

The BAST workshop is a local workshop intended to serve test professionals in the Pacific Northwest. It is unique in that all attendees are on the program. This general workshop on test includes topics such as ATE, ATPG, DFT, BIST, DFM, Quality prediction, At-Speed testing, CAD, IDDQ, Test Synthesis, and MCM, ASIC, VLSI, PCB, and System Test.

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16th CRC-IEEE BAST Workshop

Feb. 27 - Mar. 2, 2007

Bodega Bay, California

Download the Call For Participation, 2007: word, fillable pdf

(Please fill in the proposal and email to Erik Chmelar, echmelar@crc.Stanford.edu)

 

Donation welcomed word,pdf

Donation form word,pdf

Raffle Tickets

 



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Previous BAST Workshops

Pictures from previous BAST workshops
Last modified: Wed Oct 4 14:08:46 PDT 2006
Please send questions or comments to fferhani@crc.stanford.edu