CRC-IEEE BAST Workshop

The BAST workshop is a local workshop intended to serve test professionals in the Pacific Northwest. This general workshop on test includes topics such as ATE, ATPG, DFT, BIST, CAD, IDDQ, Test Synthesis, and MCM, ASIC, VLSI, PCB, and System Test.

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Ninth CRC-IEEE BAST Workshop

February 15-18, 2000

Bodega Bay, California


Call for Participation

Call for Donors

BAST 2000 Program

BAST 2000 Photos

BAST 2000 Final Report


Committee Members

General Chair: Edward J. McCluskey
Program Chair: Hong Hao
Registration Chair: Chaowen Tseng
Financial Chair/IEEE Liaison: Catherine Yu
Local Arrangements: Siegrid Munda, Nahmsuk Oh
Publicity Chair: Mike Purtell
Entertainment Chair: Davia Lu
Graphics Chair: Siyad Ma
AdministrativeSupport:Siegrid Munda

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Previous BAST Workshops

Pictures from previous BAST workshops
Last modified: Fri Apr 28 14:26:16 PDT 2000
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