CRC-IEEE BAST Workshop
The BAST workshop is a local workshop intended to serve test professionals in
the Pacific Northwest. This general workshop on test includes topics such as
ATE, ATPG, DFT, BIST, CAD, IDDQ, Test Synthesis, and MCM, ASIC, VLSI, PCB, and
System Test.

Ninth CRC-IEEE BAST Workshop
February 15-18, 2000
Bodega Bay, California
Call for Participation
Call for Donors
BAST 2000 Program
BAST 2000 Photos
BAST 2000 Final Report
General Chair:
Edward J. McCluskey
Program Chair: Hong Hao
Registration Chair: Chaowen Tseng
Financial Chair/IEEE Liaison: Catherine Yu
Local Arrangements:
Siegrid Munda, Nahmsuk Oh
Publicity Chair: Mike Purtell
Entertainment Chair: Davia Lu
Graphics Chair: Siyad
Ma
AdministrativeSupport:Siegrid Munda

Previous BAST Workshops
Pictures from previous BAST workshops
Last modified: Fri Apr 28 14:26:16 PDT 2000
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