CRC-IEEE BAST Workshop

The BAST workshop is a local workshop intended to serve test professionals in the Pacific Northwest. This general workshop on test includes topics such as ATE, ATPG, DFT, BIST, CAD, IDDQ, Test Synthesis, and MCM, ASIC, VLSI, PCB, and System Test.

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Eleventh CRC-IEEE BAST Workshop

February 5-8, 2002

Bodega Bay, California


Call for Participation

Call for Donors

BAST 2002 Program

BAST 2002 Final Report


Presentations Slides

Dwayne Burek (Logic Vision)

James Li (Stanford CRC)

Bill Price (Philips)


Committee Members

General Chair: Edward J. McCluskey
Vice-General Chair: R. Chandramouli
Co-General Chair: Subhasish Mitra
Program Chair: Scott Davidson
Registration Chair: James Li
Financial Chair/IEEE Liaison: Sungroh Yoon
Local Arrangements: Mike Purtell
Publicity Chair: Mike Purtell
Entertainment Chair: Davia Lu
Graphics Chair: Siyad Ma
AdministrativeSupport:Siegrid Munda

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Previous BAST Workshops

Pictures from previous BAST workshops
Last modified: Thu Mar 7 12:26:13 PST 2002
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