CRC-IEEE BAST Workshop
The BAST workshop is a local workshop intended to serve test professionals in
the Pacific Northwest. This general workshop on test includes topics such as
ATE, ATPG, DFT, BIST, CAD, IDDQ, Test Synthesis, and MCM, ASIC, VLSI, PCB, and
System Test.
Eleventh CRC-IEEE BAST Workshop
February 5-8, 2002
Bodega Bay, California
Call for Participation
Call for Donors
BAST 2002 Program
BAST 2002 Final Report
Presentations Slides
Dwayne Burek (Logic Vision)
James Li (Stanford CRC)
Bill Price (Philips)
General Chair:
Edward J. McCluskey
Vice-General Chair: R. Chandramouli
Co-General Chair: Subhasish Mitra
Program Chair: Scott Davidson
Registration Chair: James Li
Financial Chair/IEEE Liaison: Sungroh Yoon
Local Arrangements: Mike Purtell
Publicity Chair: Mike Purtell
Entertainment Chair: Davia Lu
Graphics Chair: Siyad
Ma
AdministrativeSupport:Siegrid Munda
Previous BAST Workshops
- Tenth CRC-IEEE BAST Workshop, February 2001
- Ninth CRC-IEEE BAST Workshop, February 2000
- Eighth CRC-IEEE BAST Workshop, February 1999
- Seventh CRC-IEEE BAST Workshop, February 1998
- Sixth CRC-IEEE BAST Workshop, February 1996
- Fifth CRC-IEEE BAST Workshop, February 1995
- Fourth CRC-IEEE BAST Workshop, February 1994
- Third CRC-IEEE BAST Workshop, October 1992
- Second CRC-IEEE BAST Workshop, February 1991
- First CRC-IEEE BAST Workshop, February 1990
Pictures from previous BAST workshops
Last modified: Thu Mar 7 12:26:13 PST 2002
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