CRC-IEEE BAST Workshop
The BAST workshop is a local workshop intended to serve test professionals in
the Pacific Northwest. This general workshop on test includes topics such as
ATE, ATPG, DFT, BIST, CAD, IDDQ, Test Synthesis, and MCM, ASIC, VLSI, PCB, and
System Test.
Twelfth CRC-IEEE BAST Workshop
February 25-28, 2003
Santa Rosa, California
Call for Participation
Call for Donors
BAST 2002 Program
BAST 2003 Final Report
Some Presentations Slides
Ahmad Al-Yamani (Stanford CRC)
Phil Burlison (Inovys)
Rudy Garcia (NP Test)
Mike Li (Wavecrest)
TM Mak (Intel)
Mehdi Tahoori (Stanford CRC)
Burnie West (NP Test)
General Chair:
Edward J. McCluskey
Co-General Chair: Subhasish Mitra
Program Chair: Samy Makar
Registration Chair: Ahmad Al-Yamani
Financial Chair/IEEE Liaison: Erik Volkerink
Local Arrangements: Nahmsuk Oh
Publicity Chair: Mike Purtell
Entertainment Chair: Davia Lu
AdministrativeSupport: Diane Nadell
Previous BAST Workshops
- Tenth CRC-IEEE BAST Workshop, February 2002
- Tenth CRC-IEEE BAST Workshop, February 2001
- Ninth CRC-IEEE BAST Workshop, February 2000
- Eighth CRC-IEEE BAST Workshop, February 1999
- Seventh CRC-IEEE BAST Workshop, February 1998
- Sixth CRC-IEEE BAST Workshop, February 1996
- Fifth CRC-IEEE BAST Workshop, February 1995
- Fourth CRC-IEEE BAST Workshop, February 1994
- Third CRC-IEEE BAST Workshop, October 1992
- Second CRC-IEEE BAST Workshop, February 1991
- First CRC-IEEE BAST Workshop, February 1990
Pictures from previous BAST workshops
Last modified: Thu Mar 6 12:26:13 PST 2003
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