CRC-IEEE BAST Workshop

The BAST workshop is a local workshop intended to serve test professionals in the Pacific Northwest. This general workshop on test includes topics such as ATE, ATPG, DFT, BIST, CAD, IDDQ, Test Synthesis, and MCM, ASIC, VLSI, PCB, and System Test.

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Twelfth CRC-IEEE BAST Workshop

February 25-28, 2003

Santa Rosa, California


Call for Participation

Call for Donors

BAST 2002 Program

BAST 2003 Final Report


Some Presentations Slides

Ahmad Al-Yamani (Stanford CRC)

Phil Burlison (Inovys)

Rudy Garcia (NP Test)

Mike Li (Wavecrest)

TM Mak (Intel)

Mehdi Tahoori (Stanford CRC)

Burnie West (NP Test)


Committee Members

General Chair: Edward J. McCluskey
Co-General Chair: Subhasish Mitra
Program Chair: Samy Makar
Registration Chair: Ahmad Al-Yamani
Financial Chair/IEEE Liaison: Erik Volkerink
Local Arrangements: Nahmsuk Oh
Publicity Chair: Mike Purtell
Entertainment Chair: Davia Lu
AdministrativeSupport: Diane Nadell

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Previous BAST Workshops

Pictures from previous BAST workshops
Last modified: Thu Mar 6 12:26:13 PST 2003
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