CRC-IEEE BAST Workshop

The BAST workshop is a local workshop intended to serve test professionals in the Pacific Northwest. It is unique in that all attendees are on the program. This general workshop on test includes topics such as ATE, ATPG, DFT, BIST, DFM, Quality prediction, At-Speed testing, CAD, IDDQ, Test Synthesis, and MCM, ASIC, VLSI, PCB, and System Test.

-----

14th CRC-IEEE BAST Workshop

February 22-25, 2005

Bodega Bay, California

download the Call For Participation, 2005 word,pdf

(Please fill in the proposal and email to Francois-Fabien Ferhani, fferhani@crc.Stanford.edu )

 

BAST 2004 program

 

donation welcomed word,pdf

Donations by Credit Card word,pdf



-----

Previous BAST Workshops

Pictures from previous BAST workshops
Last modified: Fri Feb 11 10:57:08 PST 2005
Please send questions or comments to webmaster@crc.stanford.edu

Date:  May 27, 2003