CRC-IEEE BAST Workshop

The BAST workshop is a local workshop intended to serve test professionals in the Pacific Northwest. It is unique in that all attendees are on the program. This general workshop on test includes topics such as ATE, ATPG, DFT, BIST, DFM, Quality prediction, At-Speed testing, CAD, IDDQ, Test Synthesis, and MCM, ASIC, VLSI, PCB, and System Test.

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15th CRC-IEEE BAST Workshop

Feb. 28 - Mar. 3, 2006

Bodega Bay, California

Download the Call For Participation, 2006 word,pdf

(Please fill in the proposal and email to Erik Volkerink, volkerin@crc.Stanford.edu )

 

Donation welcomed word,pdf

Donation form word,pdf

Raffle Ticket

 

BAST 2006 program

 

BAST 2006 pictures



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Previous BAST Workshops

Pictures from previous BAST workshops
Last modified: Mon Aug 22 10:57:08 PST 2006
Please send questions or comments to kycho@crc.stanford.edu