CRC-IEEE BAST Workshop
The BAST workshop is a local workshop intended to serve test
professionals in the Pacific Northwest. It is unique in that all attendees are on the program. This general workshop on test includes
topics such as ATE, ATPG, DFT, BIST, DFM, Quality prediction, At-Speed testing, CAD, IDDQ, Test Synthesis, and MCM, ASIC,
VLSI, PCB, and System Test.
15th CRC-IEEE BAST Workshop
Feb. 28 - Mar. 3, 2006
Bodega Bay, California
Download the Call For Participation, 2006 word,pdf
(Please fill in the proposal and email to Erik Volkerink, volkerin@crc.Stanford.edu
)
Donation welcomed word,pdf
Donation form word,pdf
Previous BAST Workshops
- Fourteenth CRC-IEEE BAST Workshop, February 2005
- Thirteenth CRC-IEEE BAST Workshop, February 2004
- Twelfth CRC-IEEE BAST
Workshop, February 2003
- Eleventh CRC-IEEE BAST
Workshop, February 2002
- Tenth CRC-IEEE BAST
Workshop, February 2001
- Ninth CRC-IEEE BAST
Workshop, February 2000
- Eighth CRC-IEEE BAST
Workshop, February 1999
- Seventh CRC-IEEE BAST
Workshop, February 1998
- Sixth CRC-IEEE BAST
Workshop, February 1996
- Fifth CRC-IEEE BAST
Workshop, February 1995
-
Fourth CRC-IEEE BAST Workshop, February 1994
-
Third CRC-IEEE BAST Workshop, October 1992
-
Second CRC-IEEE BAST Workshop, February 1991
-
First CRC-IEEE BAST Workshop, February 1990
Pictures from previous
BAST workshops
Last modified: Mon Aug 22 10:57:08 PST 2006
Please send questions or comments to kycho@crc.stanford.edu