CRC-IEEE BAST Workshop
The BAST workshop is a local workshop intended to serve test professionals in
the Pacific Northwest. This general workshop on test includes topics such as
ATE, ATPG, DFT, BIST, CAD, IDDQ, Test Synthesis, and MCM, ASIC, VLSI, PCB, and
System Test.

Seventh CRC-IEEE BAST Workshop
February 10-13, 1998
Bodega Bay, California
Location
Program
Gifts and Entertainment
Committee Members
BAST'98 Final Report
Previous BAST Workshops

The Seventh BAST Workshop was held in Bodega Bay, CA.
This year, each attendee received a BAST 98 jacket. We had great fun on Wednesday
night when people from each dinner table were given the task of completing a small
jigsaw puzzle. The people on the winning table won a puzzle set each, which featured
a photograph of the official mascot of the Workshop. With no coincidence, the table
led by a UC Santa Cruz Professor and students won the contest, as they were most
familiar with the mascot's appearance.
General Chair:
Edward J. McCluskey
Program Chair: R. Chandramouli and Siyad Ma
Program Committee: Mike Purtell
Registration Chair: Subhasish Mitra
Financial Chair/IEEE Liaison:
Philip P. Shirvani
Local Arrangements: Siegrid V. Munda
Publicity Chair: Jonathan T.-Y. Chang
Entertainment Chair: David Lu
Entertainment Co-Chair: Carol Tong
Graphics Chair: Siyad
Ma
AdministrativeSupport:Siegrid Munda
©CRC/siyad@shasta.stanford.edu