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Lee, D., I. Park, E. Volkerink, and E. J. McCluskey, ``A Technique to Reduce the Occurrence of Overkill," ITC'06, not accepted.

Ferhani, F.-F. and E. J. McCluskey, ``Defetive Chip Classes and Test Metrics," ITC'06, accepted under different title.


ITC'06: Proc., Int. Test Conf., Santa Clara, CA, Oct. 24--26, 2006. VTS'07: VLSI Test Symp,, Berkeley, CA, May 6--10, 2007.

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